TEST.bib

%===============Testing=======================
@inproceedings{TEST-DAC1979-Grason,
	title     = {{TMEAS}, a testability measurement program},
	author    = {Grason, John},
	booktitle = dac,
	pages     = {156--161},
	year      = {1979},
}
@inproceedings{TEST-DAC1980-Goldstein,
    title     = {{SCOAP}: Sandia controllability/observability analysis program},
    author    = {Goldstein, Lawrence H and Thigpen, Evelyn L},
    booktitle = dac,
    pages     = {190--196},
    year      = {1980},
}
@inproceedings{TEST-ATS1997-Xu,
	title     = {Testability prediction for sequential circuits using neural networks},
	author    = {Xu, Shiyi and Dias, G Percy and Waignjo, Peter and Shi, Bole},
	booktitle = ats,
	pages     = {48--53},
	year      = {1997},
}
@inproceedings{TEST-NORCHIP1997-Larsson,
    title     = {Early Prediction of Testability by Analyzing Behavioral {VHDL} Specifications},
    author    = {Larsson, Erik and Peng, Zebo},
    booktitle = {Proceedings of the NORCHIP Conference},
    pages     = {259--266},
    year      = {1997}
}
@inproceedings{TEST-DSD2006-Pecenka,
    title     = {Testability estimation based on controllability and observability parameters},
    author    = {Pecenka, Tomas and Strnadel, Josef and Kot{\'a}sek, Zdenek and Sekanina, Luk{\'a}s},
    booktitle = {EUROMICRO Conference on Digital System Design: Architectures, Methods and Tools},
    pages     = {504--514},
    year      = {2006},
}
@article{TEST-TODAES2008-Pecenka,
    title       = {Evolution of synthetic {RTL} benchmark circuits with predefined testability},
    author      = {Pecenka, Tomas and Sekanina, Lukas and Kotasek, Zdenek},
    journal     = todaes,
    volume      = {13},
    number      = {3},
    pages       = {54},
    year        = {2008},
    publisher   = {ACM}
}
@inproceedings{TEST-ITC2009-Ren,
	title     = {Low cost test point insertion without using extra registers for high performance design},
	author    = {Ren, Haoxing and Kusko, Mary and Kravets, Victor and Yaari, Rona},
	booktitle = itc,
	pages     = {1--8},
	year      = {2009},
}
@article{TEST-TOC2012-Yang,
	title     = {Test point insertion with control points driven by existing functional flip-flops},
	author    = {Yang, Joon-Sung and Touba, Nur A and Nadeau-Dostie, Benoit and others},
	journal   = toc,
	volume    = {61},
	number    = {10},
	pages     = {1473--1483},
	year      = {2012},
}
@inproceedings{TEST-ITC2015-Li,
    title        = {Efficient observation-point insertion for diagnosability enhancement in digital circuits},
    author       = {Li, Zipeng and Goel, Sandeep Kumar and Lee, Frank and Chakrabarty, Krishnendu},
    booktitle    = itc,
    pages        = {1--10},
    year         = {2015},
}
@inproceedings{TEST-VTS2016-He,
	title     = {Test-point insertion efficiency analysis for LBIST applications},
	author    = {He, Miao Tony and Contreras, Gustavo K and Tehranipoor, Mark and Tran, Dat and Winemberg, LeRoy},
	booktitle = vts,
	pages     = {1--6},
	year      = {2016},
}
@inproceedings{TEST-ITC2018-Liu,
    title        = {Back-End Layout Reflection for Test Chip Design},
    author       = {Zeye Liu and Ronald D. Blanton},
    booktitle    = itc,
    year         = {2018},
}
@article{TEST-TCAD2018-Tang,
    title        = {Simulation-Based Diagnostic Model for Automatic Testability Analysis of Analog Circuits},
    author       = {Tang, Xiaofeng and Xu, Aiqiang and Li, Ruifeng and Zhu, Min and Dai, Jinling},
    journal      = tcad,
    volume       = {37},
    number       = {7},
    pages        = {1483--1493},
    year         = {2018},
    publisher    = {IEEE},
}
@inproceedings{TEST-DAC2019-Ma,
    title     = {High Performance Graph Convolutional Networks with Applications in Testability Analysis},
    author    = {Ma, Yuzhe and Ren, Haoxing and Khailany, Brucek and Sikka, Harbinder and Luo, Lijuan and Natarajan, Karthikeyan and Yu, Bei},
    booktitle = dac,
    pages     = {18:1--18:6},
    year      = {2019},
}