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Zhang, F., Williams, K. N., Edwards, D., Naden, A. B., Yao, Y., Neumayer, S. M., Kumar, A., Rodriguez, B. J., Bassiri-Gharb, N., Maximizing Information: A Machine Learning Approach for Analysis of Complex Nanoscale Electromechanical Behavior in Defect-Rich PZT Films. Small Methods 2021, 5, 2100552. h

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Maximizing-Information_Machine_Learning_Approach

Data and Jupyter note books used in the article: Zhang, F., Williams, K. N., Edwards, D., Naden, A. B., Yao, Y., Neumayer, S. M., Kumar, A., Rodriguez, B. J., Bassiri-Gharb, N., Maximizing Information: A Machine Learning Approach for Analysis of Complex Nanoscale Electromechanical Behavior in Defect-Rich PZT Films. Small Methods 2021, 5, 2100552. https://doi.org/10.1002/smtd.202100552

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Zhang, F., Williams, K. N., Edwards, D., Naden, A. B., Yao, Y., Neumayer, S. M., Kumar, A., Rodriguez, B. J., Bassiri-Gharb, N., Maximizing Information: A Machine Learning Approach for Analysis of Complex Nanoscale Electromechanical Behavior in Defect-Rich PZT Films. Small Methods 2021, 5, 2100552. h

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